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eBook System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability (Systems on Silicon) download

by Laung-Terng Wang,Charles E. Stroud,Nur A. Touba

eBook System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability (Systems on Silicon) download ISBN: 012373973X
Author: Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
Publisher: Morgan Kaufmann; 1 edition (December 4, 2007)
Language: English
Pages: 896
ePub: 1795 kb
Fb2: 1980 kb
Rating: 4.4
Other formats: azw lrf mobi lrf
Category: Engineering
Subcategory: Engineering

This book is the more system oriented variation and addition to VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) published earlier by . You get the most complete and up-to-date summary of DfT methodes and techniques

This book is the more system oriented variation and addition to VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) published earlier by . You get the most complete and up-to-date summary of DfT methodes and techniques. I am using the book at work and for teaching students at the University.

System-on-chip test architectures. Laung-Terng Wang Charles E. Stroud Nur A. Touba.

System-on-Chip Test Architectures: Nanometer Design for Testability. by Laung-Terng Wang, Charles E. Stroud, and Nur A. Modern electronics testing has a legacy of more than 40 years.

Laung-Terng Wang, P. is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE P. degree from Stanford University. A Fellow of the IEEE, he holds 18 .

Nanometer Design for Testability. Authors: Laung-Terng Wang Charles Stroud Nur Touba. Hardcover ISBN: 9780123739735.

System-On-Chip Test Architectures book. Goodreads helps you keep track of books you want to read. Start by marking System-On-Chip Test Architectures: Nanometer Design for Testability as Want to Read: Want to Read saving. Start by marking System-On-Chip Test Architectures: Nanometer Design for Testability as Want to Read: Want to Read savin. ant to Read.

Similar books to System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon). This book is the more system oriented variation and addition to VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) published earlier by .

If one of the more basic books on testing is not adequate for your requirements, this text would make a nice addition to your library

If one of the more basic books on testing is not adequate for your requirements, this text would make a nice addition to your library. It would also do well as a text in an advanced graduate course. Do you want to read the rest of this article?

Laung-Terng Wang, Charles E. Stroud, Nur Touba.

Laung-Terng Wang, Charles E. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost.

Chapter 1. Introduction Laung-Terng (. T. Charles E. StroudAuburn University, Auburn, Alabama. Nur A. ToubaUniversity of Texas, Austin, Texas. WangSynTest Technologies, In. Sunnyvale, California Charles E. StroudAuburn University, Auburn, Alabama Nur A. ToubaUniversity of Texas, Austin, Texas About This Chapter Ove. Selection from System-on-Chip Test Architectures: Nanometer Design for Testability Charles E. Over the past three decades, we have seen the semiconductor manufacturing technology advance from 4 microns to 45 nanometers.

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs.Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples.Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book.Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits.Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing.Practical problems at the end of each chapter for students.
Comments: (2)
Wetiwavas
Buy this book if you already have good knowledge on VLSI. Doesn't start from basics.

Price:
The book is unnecessarily large with big font and more space.
I felt like I am paying for the extra boundaries left on each of the page.
Tyler Is Not Here
This book is the more system oriented variation and addition to VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) published earlier by L.T. Wang.
You get the most complete and up-to-date summary of DfT methodes and techniques. I am using the book at work and for teaching students at the University. For teaching you are granted access to training material and ATPG software to use with students for free.